Instruments

X-ray Diffractometer

Rigaku SmartLAB X-ray Diffractometer (XRD)

Features:

• X-ray rotantig anode with 2 targets - Cu and Mo
• in-plane geometry with 5-axis goniometer
• high energy-resolution 2D detector
• wide temperature range: -180°C to 1500°C
• available for measurement of powder samples, capillaries, thin films, operando battery cells

Combined STM/nc-AFM

SPECS Aarhus 150 Scanning Tunneling Microscope

Features:

Glovebox with transfer stage

Dual Magnetron Sputterer

Quorum Q300T D dual magnetron sputterer

Features:

• Vacuum pressure of up to 5x10⁻⁵ mbar
• Dual sputter head for in-situ sequential coating of samples (Ø up to 150 mm) with different metals
• Capable of sputtering non-oxidizing and oxidizing metals e.g. Cr, Ir, W, Al, Ti, Au, Pt

MicroWriter

Durham MagnetoOpics MicroWriter ML3

Features:

Schottky Field-Emission Scanning Electron Microscope

Jeol JSM-IT800SHL Schottky Field-Emission Scanning Electron Microscope (SEM) with Raman spectroscopy capabilities

Features:

• Schottky Field-Emission SEM
• Energy Dispersive X-ray Spectrometer (EDS)
• Secondary (SE) and back-scattered (BS) electrons detection
• Raman-SEM capabilities

Specs:

Scanning Near-Field Optical Microscope

attocube neaspec VIS-neaSCOPE+s Scanning Near-Field Optical Microscope (SNOM)

Specs:

• Excitation wavelengths: He-Ne: 633 nm
• Tapping mode AFM
• s-SNOM

Other

 (XRD, TGA, uv/vis/nir, electrochemistry, transport lab) 

UHV

UHV page + TPD

Microscale characterization

Ramans - don't forget to get info on Matej's SMS, fluorolog with microscope, ellipsommetry